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Fig. 3 | Advanced Structural and Chemical Imaging

Fig. 3

From: Detecting structural variances of Co3O4 catalysts by controlling beam-induced sample alterations in the vacuum of a transmission electron microscope

Fig. 3

Dose dependent atom reconfigurations in surface proximity captured in sequential phase images. The mid-voltage range electron beam acceleration is 80 kV. A pristine spinel Co3O4 [114] particle is displayed in (a). Compared with the single images of Fig. 2a, its contrast is enhanced by reconstructing the complex electron exit wave functions from focus series of 40 images. Electron dose rates, the total dose per image series, and the accumulated electron dose are listed. Nano-diffraction patterns are shown in the insets. A simulated image pattern of spinel Co3O4 [114] is depicted in the inset of (a). The arrows and circles point to electron beam-induced surface alterations that occurred as a result of exposing the sample to an increasing number of electrons as listed. The sample was prepared by the high throughput printing process. b–f Are successive phase images of reconstructed wave functions that were recorded with the listed dose rates, total dose of the image series and accumulated electron dose

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