Atom Probe Tomography
Advanced Structural and Chemical Imaging welcomes submissions to the new thematic series of the 'Atom Probe Tomography'. The application of Atom Probe Tomography (APT) is currently growing rapidly and is on the path of becoming a mainstream nanoscale chemical mapping technique. Exciting new materials applications ranging from geological materials to organic biological materials have recently been demonstrated, establishing a much broader breadth of materials application space beyond more conventional metallurgical applications. Concomitantly, the number of academic and government laboratory research groups utilizing APT is also growing, including adoption by new industries such as the semiconductor industry. However, without any established standards and best practices, new groups looking to apply APT to their research have the potential for the collection, analysis, and reporting of erroneous or misguided APT based results. This situation is even more critical as some novice users look to demonstrate the APT applicability to new and exciting material systems not reported on before. To address this situation, we decided to launch a special issue focusing on the discussion and development of best practice procedures for specimen preparation, data collection and analysis including mass spectral analysis, terminology, and data reporting. Ultimately we envision a collection of manuscripts, either individual and review style articles, that help define the need for a specific best practice procedure or approach (i.e. define a problem) and very importantly, provide a potential best practice solution.
The potential topics include, but are not limited to the following scopes:
- Development of best practice procedures for specimen preparation, data collection and analysis including mass spectral analysis, terminology, and data reporting for atom probe tomography
- Quantification and correction of artifacts during reconstruction of atom probe tomography data from heterogeneous materials.
- Specimen shape, specimen orientation and specimen preparation method considerations for reliable atom probe tomography analysis of materials
- Influence of analysis parameters like laser pulse energy, wavelength, applied electric field and base temperature on atom probe tomography results
- Challenges of atom probe tomography reconstruction methods or mass-to-charge spectra analysis
- New applications for correlative microscopy of materials with atom probe tomography
- Utilizing crystallographic information in atom probe tomography data for standardizing reconstruction process.
- Understanding evaporation fields of materials and its dependency on specimen temperature or applied laser during atom probe tomography
- Other topics related to application of atom probe tomography for material characterization.
Before submitting your manuscript, please ensure you have carefully read the Instructions for Authors for Advanced Structural and Chemical Imaging. The complete manuscript should be submitted through the Advanced Structural and Chemical Imaging submission system. To ensure that you submit to the correct thematic series please select the appropriate section in the drop-down menu upon submission. In addition, indicate within your cover letter that you wish your manuscript to be considered as part of the thematic series on Atom Probe Tomography. All submissions will undergo rigorous peer review and accepted articles will be published within the journal as a collection.
Deadline for submissions:
31 July 2017
Lead Guest Editors:
Danny Perea, Pacific Northwest National Laboratory
Arun Devaraj, Pacific Northwest National Laboratory
Submissions will also benefit from the usual advantages of open access publication:
- Rapid publication: Online submission, electronic peer review and production make the process of publishing your article simple and efficient
- High visibility and international readership in your field: Open access publication ensures high visibility and maximum exposure for your work - anyone with online access can read your article
- No space constraints: Publishing online means unlimited space for figures, extensive data and video footage
- Authors retain copyright, licensing the article under a Creative Commons license: articles can be freely redistributed and reused as long as the article is correctly attributed
For editorial enquiries please contact email@example.com.
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Annual Journal Metrics
66 days to first decision for reviewed manuscripts only
66 days to first decision for all manuscripts
116 days from submission to acceptance
21 days from acceptance to publication
9 Altmetric mentions
- ISSN: 2198-0926 (electronic)