Simulated STEM images. Example frames from simulated series of electron microscopy images. Left column shows ground truths including STEM scan distortions but no shot noise. Crystals with average detected electrons per pixel are as follows: (A) perfect gallium nitride (0.66 to 3.47), (C) and (E) perfect silicon (0.28 to 1.94) and (0.37 to 6.68), (G) silicon with dislocation (1.4 to 9.7). Right column shows the same images with Poisson shot noise. The respective peak electron counts per pixel are as follows: (B) 12, (D) 9, (F) 21, and (H) 15.