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Table 7 Fidelity ( 29 ), in picometers, between ground truths and noisy (denoised) images

From: Poisson noise removal from high-resolution STEM images based on periodic block matching

Input

Peak

Dose [C/cm 2 ]

Fidelity [pm]

np-l16

np- π N16

np- π U16

Silicon (disloc.)

6

0.5476

17.81

n/a

2.71

1.66

Silicon

6

0.7853

8.59

2.77

1.32

1.29

Gallium nitride

7

1.5400

17.09

3.43

1.16

1.16

Silicon

9

1.5706

7.75

1.57

0.74

0.73

Silicon (disloc.)

11

2.8064

n/a

0.65

0.50

0.54

Gallium nitride

12

3.8499

5.54

0.70

0.59

0.57

Silicon (disloc.)

15

5.6812

1.26

0.49

0.38

0.43

Silicon

21

7.8530

0.98

0.73

0.35

0.37

Silicon

34

15.7061

0.56

0.53

0.28

0.28

Silicon (disloc.)

49

28.4745

0.42

0.30

0.27

0.29

  1. Root mean square of the distances between atom centers as detected in the noisy (denoised) image and the ground truth, with the value ‘n/a’ indicating that no neighboring atoms could be detected in the noisy (denoised) image. The best result in each row is in bold face.