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Table 7 Fidelity ( 29 ), in picometers, between ground truths and noisy (denoised) images

From: Poisson noise removal from high-resolution STEM images based on periodic block matching

Input Peak Dose [C/cm 2 ] Fidelity [pm] np-l16 np- π N16 np- π U16
Silicon (disloc.) 6 0.5476 17.81 n/a 2.71 1.66
Silicon 6 0.7853 8.59 2.77 1.32 1.29
Gallium nitride 7 1.5400 17.09 3.43 1.16 1.16
Silicon 9 1.5706 7.75 1.57 0.74 0.73
Silicon (disloc.) 11 2.8064 n/a 0.65 0.50 0.54
Gallium nitride 12 3.8499 5.54 0.70 0.59 0.57
Silicon (disloc.) 15 5.6812 1.26 0.49 0.38 0.43
Silicon 21 7.8530 0.98 0.73 0.35 0.37
Silicon 34 15.7061 0.56 0.53 0.28 0.28
Silicon (disloc.) 49 28.4745 0.42 0.30 0.27 0.29
  1. Root mean square of the distances between atom centers as detected in the noisy (denoised) image and the ground truth, with the value ‘n/a’ indicating that no neighboring atoms could be detected in the noisy (denoised) image. The best result in each row is in bold face.