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Fig. 4 | Advanced Structural and Chemical Imaging

Fig. 4

From: Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Fig. 4

Comparison of example φ y displacement fields (φ x not shown) from one frame of an ADF image series of a [110] oriented PtCo bimetallic nanoparticle determined using the ‘unlocked’, ‘row-locked’ and ‘row-fitted’ approaches. From left to right, the smoothing kernel size is also varied. The colour scale shows units of pixels. The reference image is shown far right for comparison, and grey numbers indicate the total calculation time

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