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Fig. 2 | Advanced Structural and Chemical Imaging

Fig. 2

From: Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averaging

Fig. 2

Topographic images due to various tip separations. Superpositions of the two IOA current sources with (b times) an STM tip half-separation a bu = 0, b bu = 0.6, c bu = 0.74, and d bu = 0.77 = π/4 − ε units in the horizontal direction, relative to the IOA p4mm surface wave functions having a period of 2π. A unit cell is inset in each case

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