Skip to main content
Fig. 4 | Advanced Structural and Chemical Imaging

Fig. 4

From: Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averaging

Fig. 4

Plane symmetry enforcement at these tip separations. Plane symmetry enforcement of the underlying p4mm symmetry for the superposition of IOA p4mm wave functions with (b times) an STM tip half-separation of Fig. 2. a bu = 0, b bu = 0.6, c bu = 0.74, and d bu = 0.77 = π/4 − ε units in the horizontal direction, relative to the IOA p4mm surface wave functions having a period of 2π

Back to article page