Fig. 4From: Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averagingPlane symmetry enforcement at these tip separations. Plane symmetry enforcement of the underlying p4mm symmetry for the superposition of IOA p4mm wave functions with (b times) an STM tip half-separation of Fig. 2. a bu = 0, b bu = 0.6, c bu = 0.74, and d bu = 0.77 = π/4 − ε units in the horizontal direction, relative to the IOA p4mm surface wave functions having a period of 2π Back to article page