Fig. 5From: Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averagingThe effect of uneven tip height on Topographic images. Superpositions of the two IOA current sources with (b times) an STM tip half-separation bu = 0.77 = π/4 − ε units in the horizontal direction, relative to the IOA p4mm surface wave functions having a period of 2π. In a both tips are at the same height. In b one tip is 20 % higher from the surface than the other, and c 50 % higherBack to article page