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Fig. 5 | Advanced Structural and Chemical Imaging

Fig. 5

From: Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averaging

Fig. 5

The effect of uneven tip height on Topographic images. Superpositions of the two IOA current sources with (b times) an STM tip half-separation bu = 0.77 = π/4 − ε units in the horizontal direction, relative to the IOA p4mm surface wave functions having a period of 2π. In a both tips are at the same height. In b one tip is 20 % higher from the surface than the other, and c 50 % higher

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