Skip to main content
Fig. 10 | Advanced Structural and Chemical Imaging

Fig. 10

From: Assessment of off-axis and in-line electron holography for measurement of potential variations in Cu(In,Ga)Se2 thin-film solar cells

Fig. 10

In-line holography at CIGS grain boundary. a–c In-focus TEM micrographs acquired on different microscopes, d–f intensity derivatives dI/dz obtained within the last iteration of the reconstruction procedure according to the NR approach based on five images and g–i the corresponding reconstructed phase images. The modified TIE as described in the methods section was applied for all reconstructions. The modifications include symmetrization, Tikhonov-type filtering with q \(_{\mathrm{c}}\) = 0.001 Å\(^{-1}\), 200 alignment iterations and the estimation of the intensity derivative according to the NR approach. The series acquired on the Jeol 2200FS and the Jeol ARM 200F contain defocus images of \(\Delta z_1\) = \(\pm\)3.2 µm and \(\Delta z_2\) = \(\pm\)6.4 µm and the series acquired on the Hitachi I2TEM contains images with the defoci \(\Delta z_1\) = \(\pm\)10.5 µm and \(\Delta z_2\) = \(\pm\)21 µm. The rectangles marked as 1 and 2 in the phase images indicate the regions where the profiles shown in Fig. 11 were extracted. Furthermore, the reference area is shown where the phase shift was set to zero

Back to article page