Fig. 4From: Assessment of off-axis and in-line electron holography for measurement of potential variations in Cu(In,Ga)Se2 thin-film solar cellsOff-axis holography on standard CIGS solar cell. a, b Reconstructed phase images from off-axis holograms acquired on a solar cell with standard CIGS (GGI\(\sim\)0.36 , CGI\(\sim\)0.79). c HAADF-STEM and d BF-STEM micrographs show the same region of the solar cell. The intensity profiles, that were extracted from the phase images and the HAADF-STEM image within the marked boxes (A\(_{1}\), A\(_{2}\), B\(_{1}\) , and B\(_{2}\), resp. A and B), are given in Fig. 5a, bBack to article page