Fig. 8From: Assessment of off-axis and in-line electron holography for measurement of potential variations in Cu(In,Ga)Se2 thin-film solar cellsInhomogeneities in the pn-junction region. a HAADF-STEM and b BF-STEM image of the solar cell with an absorber layer with high Cu content in the ZnO/CdS/CIGS interface region. The regions marked by the red squares are analyzed by off-axis holography in Fig. 9 Back to article page