Skip to main content

Table 1 Measured aberrations for the electron probes (shown in Figs. 2, 3) used in the experiments

From: Detecting magnetic ordering with atomic size electron probes

  Corrected probe C34-aberrated probe
Aberration Value Value
C21a, C21b 225, 129 (nm) 157, 196 (nm)
C23a, C23b −185, 44.1 (nm) −173, 48.7 (nm)
C3 −0.01 (μm) −1.85 (μm)
C32a, C32b −1.78, 4.22 (μm) 5.08, 9.13 (μm)
C34a, C34b 0.67, −0.31 (μm) 9.95, 11.5 (μm)
C41a, C41b −210.7, −262.3 (μm) −210.7, −262.3 (μm)
C43a, C43b 348.5, −97.9 (μm) 348.5, −97.9 (μm)
C45a, C45b 68.0, −0.03 (μm) 68.0, −0.03 (μm)
C5 −0.19 (mm) −0.19 (mm)
C52a, C52b −1.18, −7.41 (mm) −1.18, −7.41 (mm)
C54a, C54b −1.75, −0.14 (mm) −1.75, −0.14 (mm)
C56a, C56b −0.63, −0.17 (mm) −0.63, −0.17 (mm)
  1. Defocus, C12a and C12b were corrected manually during data acquisition. C12s were corrected within few tens of nanometers until the images show the best contrast. Here, the subscripts a and b refer to the optical axes of the corrector