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Fig. 7 | Advanced Structural and Chemical Imaging

Fig. 7

From: Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

Fig. 7

Comparison of two images of a cerebellum block with a 30-nm-thick blank plastic overlay acquired with 1.5-keV probe-beam-landing energy. a Image acquired with 1.5-keV high tension and no deceleration. b Image acquired with 3-keV high tension and −1.5-keV deceleration potential. Both images show a near equivalent penetration depth. However, b shows a significant improvement in signal as a result of BSE re-acceleration

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