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Fig. 8 | Advanced Structural and Chemical Imaging

Fig. 8

From: Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

Fig. 8

Relative contribution of backscattered and secondary electrons from the sample to the detection signal. Type SE1 electrons are created by interactions with the primary electron (PE) beam. Type SE2 electrons are created by interactions with the BSE. Low-energy SE electrons (<50 eV) typically have mean free paths between scattering events of 5–15 nm, depending on the sample composition, and do not escape from the sample unless they are produced extremely close to the specimen surface. BSEs can scatter out from deep inside the sample and be detected

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