Fig. 4From: Structural damage reduction in protected gold clusters by electron diffraction methodsData acquisition on a S-NBD technique. Set of electron diffraction patterns acquired on a scanned area at 500 K× in a JEOL 2010F, taken with a scanning time of 100 ms per pattern the estimated radiation dose, recorded within the screen of the microscope, is ∼1350 \({\bar{\text{e}}}\) Å−2 Back to article page