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Fig. 5 | Advanced Structural and Chemical Imaging

Fig. 5

From: Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples

Fig. 5

a Aberration-corrected exit wave amplitude of the Si\(_3\)N\(_4\) sample. b, c Peak positions labeled in a plotted relative to positions inside the ideal unit cell for best-fit peaks before and after aberration correction respectively. All peak displacements from the ideal positions are scaled by a factor of 4 for the plotting, numbers indicate the RMS displacement in picometers. d, e Bond lengths from almost all peaks measured in image from before and after aberration-corrected images respectively

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