Fig. 7From: Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples a, b Phase images of an off-axis hologram measurement of a Si sample with an [011] orientation, for the uncorrected and corrected exit waves respectively. Fitted aberration function is shown inset in b with an outer radius of 12 nm\(^{-1}\). c, d Line traces taken from a and b respectivelyBack to article page