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Table 1 Numerical aberration coefficients measured in this study for the Si\(_3\)N\(_4\), graphene grain boundary and silicon wedge experimental datasets

From: Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples

Order

CEOS

Si\(_3\)N\(_4\)

Graphene

Si Wedge

m

n

Name

\(C^x\)

\(C^y\)

\(C^x\)

\(C^y\)

\(C^x\)

\(C^y\)

0

2

\(A_1\)

0.7

2.0

4.0

−4.7

0.0

2.0 nm

0

3

\(A_2\)

−5.2

66.5

60.1

−112

−15.3

−35.7 nm

1

1

\(B_2\)

10.4

67.6

−123

−79.8

23.0

84.8 nm

0

4

\(A_3\)

0.6

0.2

−5.6

−2.8

−1.4

−1.6 μm

1

2

\(S_3\)

−1.5

0.0

−3.4

4.3

1.0

−1.4 μm

0

5

\(A_4\)

0.7

−4.6

−26.3

31.2

−7.9

5.6 μm

1

3

\(D_4\)

−6.7

−15.0

−26.1

18.7

8.6

12.6 μm

2

1

\(B_4\)

31.7

−47.8

99.2

55.7

−5.0

−30.3 μm

0

6

\(A_5\)

−1.4

0.3

−0.8

−3.1

0.0

0.0 mm

1

4

\(R_5\)

−0.2

-0.3

1.1

0.6

0.0

0.2 mm

2

2

\(S_5\)

2.6

−0.2

0.5

−1.9

−0.6

0.5 mm