Fig. 3

Quantifying the uncertainty in measurements of atomic spacings as a consequence of image acquisition methodology: a conventional HAADF-STEM image acquisition and b image constructed from a rapidly acquired image stack by rigid and non-rigid registration. Distribution of distances between Sr atoms along the c slow scan direction ([111]), and d fast scan direction ([\(11\overline{2}\)]), comparing the images from a and b. e Sr plane spacings along: e slow scan direction (111), and f fast scan direction (\(11\overline{2}\)). g and h: similar to e and f, but comparing uncertainties for the different sublattices from a different data set processed using Smart Align