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Fig. 5 | Advanced Structural and Chemical Imaging

Fig. 5

From: Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite

Fig. 5

Detecting transient responses by dynamic X-ray imaging. Triangular electric field waveforms were applied to the BFO films at frequencies of 5 Hz (a) and 10 Hz (b). Simultaneously, XDM images were acquired at frame rates of 20 Hz, respectively. Note that each point in the time-series corresponds to a raw XDM image. By un-mixing the signals found in XDM by independent component analysis, we extract both the spatial distributions of BFO domains that respond synchronously to this waveform (a), but also find the onset of time-dependent reduced piezoelectric response due to polarization fatigue. In b independent component 2 shows larger intensity fluctuations than IC2 in a, indicating the onset of transient piezoelectric response. The rectangular boxes in the plots of the independent components (left) indicate the time intervals from which the close-up views are shown (right panels in a, b)

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