Fig. 3From: A fast image simulation algorithm for scanning transmission electron microscopyComparison of Multislice and PRISM simulations of a single converged electron probe. a Three-dimensional view of the atomic structure consisting of a defected Pt decahedral nanoparticle, resting up an amorphous carbon support. Entrance and exit planes shown in black. b Sum of projected potentials with inset around probe position shown in d, and initial probe amplitude at the same location shown in c. Realspace images of probe amplitude after passing through sample for e the multislice method, and f–i using various interpolation factors f for the PRISM method. Diffraction space images of probe amplitude after passing through sample for j the multislice method, and k–n using various interpolation factors f for the PRISM method. o–s Radially integrated intensities of j–n, respectively, with multislice result overlaid in p–s for comparisonBack to article page