Fig. 11From: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticlesThe MAE of the planar strain due to noise at each lattice point for a Wiener filtered noisy image at a sampling of 0.2 Å/pixel, a dose of \(10^3\) \(e^{-}/{\AA }^2\) and a defocus \(\Delta f = 8.5\) nmBack to article page