Fig. 4From: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticlesSlices along the dashed lines in Fig. 3. The black vertical lines indicate the true atomic positions and the red vertical lines indicate the corresponding measured maxima positions. For the ideal model the measured distance between the outermost peaks is too large by 0.006 nm or 2% of the interatomic distance in the slice direction. For the images that include temperature effects, the same measurement is too small by 0.025 nm or 10% of the interatomic distanceBack to article page