Fig. 6

The top row shows simulated images for a nanoparticle with a diameter of 4 nm. The bottom row shows the corresponding distribution of errors in the planar strain. The defocus is different in each column, as indicated in the figure
The top row shows simulated images for a nanoparticle with a diameter of 4 nm. The bottom row shows the corresponding distribution of errors in the planar strain. The defocus is different in each column, as indicated in the figure