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Fig. 3 | Advanced Structural and Chemical Imaging

Fig. 3

From: Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging

Fig. 3

Image windowing and SVD-based denoising algorithm applied to four atomically resolved images. a, e, i, m Original images showing varying levels of noise, number of atoms, and presence of contaminants. b, f, j, n Variance of the SVD components and the number of components used to reconstruct images shown by the red line. c, g, k, o Denoised images obtained by reconstructing using a subset of the SVD components. d, h, l, p Noise removed from images, calculated as the difference between the original and denoised images

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