Fig. 3From: Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imagingImage windowing and SVD-based denoising algorithm applied to four atomically resolved images. a, e, i, m Original images showing varying levels of noise, number of atoms, and presence of contaminants. b, f, j, n Variance of the SVD components and the number of components used to reconstruct images shown by the red line. c, g, k, o Denoised images obtained by reconstructing using a subset of the SVD components. d, h, l, p Noise removed from images, calculated as the difference between the original and denoised imagesBack to article page