Skip to main content
Fig. 5 | Advanced Structural and Chemical Imaging

Fig. 5

From: Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging

Fig. 5

Pattern matching approach for identifying and classifying atoms. a Image denoised using the denoising algorithm presented in this paper. b Map of cluster labels obtained from k-means clustering on a subset of the components obtained via SVD on the windowed dataset. Patterns to be used for pattern matching are shown by the black squares in b and are expanded in c. d Overlays of pattern matching scores ranging from 0 to 1 for each pattern. Results for the different motifs are distinguished by color. The color is set to transparent for a matching score of 0 and to the solid color corresponding to the motif for a matching score of 1. e Binary maps of pattern matching scores after thresholding to either 0 or 1. f Positions of the atoms identified for each motif obtained from the centroids of the segments in e. The d pattern matching scores, e thresholded scores, and f atom positions have been superimposed over a black-and-white map of the denoised image shown in a

Back to article page