Fig. 6From: Micro-Extinction Spectroscopy (MExS): a versatile optical characterization techniqueReflectance MExS characterization of WS2. Spectrum images (a, b) and corresponding optical images (c, d) are both used to locate regions of interest. e Reflectance spectra for the region of interest indicated by arrows in a, b for a multilayer of WS2 (646 nm exciton peak) and for a monolayer of WS2 (616 nm exciton peak), respectivelyBack to article page