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Fig. 1 | Advanced Structural and Chemical Imaging

Fig. 1

From: Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope

Fig. 1

Four-dimensional data collection on a universal detector in a scanning transmission electron microscope. a Schematic of 4D-STEM acquisition. Standard detector: from 9 × 9 scan a 9 × 9 2D image is returned. Universal detector: from a 9 × 9 scan a 9 × 9 × 128 × 128 4D dataset is returned, where a Ronchigram is recorded for each probe position. b Different STEM signals can be reconstructed from a single 4D dataset by masking and integrating to the corresponding detector angles on each Ronchigram. c Crystal structure of DyScO3 (DSO). d STEM image acquired on standard HAADF detector. eg Reconstructed STEM images from 4D dataset for e BF detector (Mask: < 30 mrad), f ADF detector (Mask: > 45 mrad), and g ABF detector (Mask: 15–30 mrad). The different reconstructed images have the same properties as images that would be recorded on dedicated detectors at those same collection angles

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