Fig. 6From: An open-source software ecosystem for the interactive exploration of ultrafast electron scattering dataScattering pattern alignment based on the masked normalized cross-correlation algorithm. a Reference scattering patterns of polycrystalline chromium. b Misaligned scattering pattern. c Difference between the patterns in a and b shows structure indicative of a sideways shift. Note that the beam block has not moved. d Pixel mask of the beam block. Black pixels represent zones to be ignored by the alignment procedure. e Aligned image, registered without the mask in d. f Difference between a and e shows residual misalignment. g Aligned image, registered with the mask in d. f Difference between a and g shows successful alignmentBack to article page