Fig. 1

SPED data from a GaAs nanowire and virtual dark-field images formed by plotting the intensity within the disks marked around \(\lbrace 111\rbrace\) reflections, as a function of probe position. a Without precession and b with 35 mrad precession. Diffraction pattern and VDF image scale bars are common to all subfigures and measure 1 Å\(^{-1}\) and 150 nm respectively. The approximate position of the carbon film is indicated by the red dashed line