Fig. 2From: Unsupervised machine learning applied to scanning precession electron diffraction dataSVD and ICA analysis of SPED data from a GaAs nanowire. a Scree plot of variance explained by each SVD component for 0, 9 and 35 mrad data. b First 3 SVD components for 35 mrad data. c ICA components for 35 mrad data. Intensities in red indicate positive values and those in blue indicate negative values. Pattern and loading scale bars are common to all subfigures and measure 1 Ã…\(^{-1}\) and 150Â nm respectivelyBack to article page