Fig. 3From: Unsupervised machine learning applied to scanning precession electron diffraction dataNMF and fuzzy clustering of SPED data from a GaAs nanowire. a, b NMF factors and corresponding loading maps. c Two-dimensional projection of 3 component SVD loadings onto the plane of the second and third loading with cluster membership as contours. d, e Weighted average cluster centre patterns. Pattern and loading scale bars are common to all subfigures and measure 1 Ã…\(^{-1}\) and 150Â nm respectivelyBack to article page