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Fig. 3 | Advanced Structural and Chemical Imaging

Fig. 3

From: Unsupervised machine learning applied to scanning precession electron diffraction data

Fig. 3

NMF and fuzzy clustering of SPED data from a GaAs nanowire. a, b NMF factors and corresponding loading maps. c Two-dimensional projection of 3 component SVD loadings onto the plane of the second and third loading with cluster membership as contours. d, e Weighted average cluster centre patterns. Pattern and loading scale bars are common to all subfigures and measure 1 Å\(^{-1}\) and 150 nm respectively

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