Fig. 4

SPED data from a GaAs nanowire with a twin boundary at an oblique angle to the beam. a Virtual dark-field images formed, using a virtual aperture 4 pixels in diameter, from the circled diffraction spots. b NMF decomposition results. c Clustering results. For b and c the profiles are taken from the line scans indicated, and the blue profile represents the intensity of the background component. Pattern and loading scale bars are common to all subfigures and measure 1 Å\(^{-1}\) and 70 nm respectively