Fig. 6From: Unsupervised machine learning applied to scanning precession electron diffraction dataNon-independent components. a Expected result for an artificial dataset with two ‘phases’ with overlapping peaks. b NMF decomposition. c Cluster results. d SVD loadings of the dataset, used for clustering. Each point corresponds to a diffraction pattern in the scan—several are indicated with the dotted lines. Contours indicate the value of membership to the two clusters—refer to “Methods” section “Data clustering”Back to article page