Skip to main content
Fig. 1 | Advanced Structural and Chemical Imaging

Fig. 1

From: Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations

Fig. 1

TEM images of the patch on the HFPP film, phase shift evolution, and defocus change with respect to the initial defocus \(\Delta f_{0}\) over time for cases A, B, and C. ac Case A: small ZOB without HFPP heating. Contamination forms at the center of the ZOB. The phase shift is positive and the defocus is stable (initial value: \(\Delta f_{0} = - 9.96\) µm). df Case B: small ZOB with HFPP temperature of 200 °C. No contamination is visible on the HFPP film. A defocused image of the film shows a dark shadow that originates from the irradiation by the ZOB. The phase shift is negative and amounts to about − 0.8π after 2 min. The defocus changes by about 5% (initial value: \(\Delta f_{0} = - 0.62\) µm). Note the different time scale compared to case A. gi Case C: large ZOB without heating. Contamination forms at the rim of the ZOB. The phase shift is negative and reaches a value of − 3.5π after 2–3 min. The defocus changes by about 18% (initial value: \(\Delta f_{0} = - 1.73\) µm)

Back to article page