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Fig. 3 | Advanced Structural and Chemical Imaging

Fig. 3

From: Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations

Fig. 3

TEM images of a CNT sample without HFPP and with an HFPP under case B conditions (small ZOB with HFPP temperature 200 °C, \(\varphi_{\text{PP}} \left( 0 \right) = - 0.8 \pi\)). a Conventional TEM image without HFPP close to focus. The sample is hardly visible. b Conventional TEM image without HFPP in underfocus conditions. CNT bundles and single CNTs become visible. c HFPP TEM image close to focus with significantly increased contrast. A bright halo appears around the CNT bundles. d Intensity line profiles along the arrows in ac. The background signal in the HFPP image is reduced by 21% due to inelastic scattering in the HFPP film. The intensity is normalized with respect to the vacuum intensity without HFPP

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