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Fig. 3 | Advanced Structural and Chemical Imaging

Fig. 3

From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Fig. 3

Cross-section a 30 keV BF- and b 30 keV HAADF–STEM images of alternating PTB7 and PC71BM layers in the wedge-shaped TEM specimen. Images in a and b are post-processed according to the procedure described in “Materials and methods” section. White arrows in b indicate bright lines, which result from a comparatively high S concentration in remnants of undissolved PEDOT:PSS. Normalized STEM intensity profiles perpendicular to the layer system are shown in c for the BF–STEM image at a wedge thickness of 100 nm along the grey arrow in a and for the HAADF–STEM image at wedge thicknesses of d 100 nm, e 475 nm, and f 770 nm along the black arrows in b

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