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Fig. 4 | Advanced Structural and Chemical Imaging

Fig. 4

From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Fig. 4

Line profiles of measured BF–STEM intensity of PTB7 (black line) and PC71BM (blue line) and corresponding MC simulations for PTB7 (red line) and PC71BM (green line) as a function of the sample thickness for an electron energy of 30 keV. The inset shows the corresponding cross-section BF–STEM image of the wedge-shaped specimen. The arrows mark the positions of the intensity line profiles acquired from the wedge edge along the direction of increasing wedge thickness. Error bars result from the effect of the uncertainty of the material densities given Table 1 on the simulated BF–STEM intensity

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