Skip to main content
Fig. 5 | Advanced Structural and Chemical Imaging

Fig. 5

From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Fig. 5

a HAADF–STEM images of the wedge-shaped TEM specimen with stacked pure PC71BM and PTB7 layers taken at primary electron energies between 10 and 30 keV. Black arrows mark the position where contrast inversion occurs between PTB7 and PC71BM. Images in a are post-processed according to the procedure described in “Materials and methods” section. Measured (black curves) and simulated HAADF–STEM intensities of b, d PTB7 and c, e PC71BM (see legend for different scattering cross-sections) as a function of the thickness are shown for primary electron energies of b, c 15 and d, e 30 keV, respectively. Black dotted lines indicate the thickness at the maximum of the measured curves. The meaning of the dotted yellow lines in d, e are explained in context with Fig. 6. Error bars indicate the uncertainties with respect to the local specimen thickness

Back to article page