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Advanced Structural and Chemical Imaging
Fig. 7 | Advanced Structural and Chemical Imaging

Fig. 7

From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Fig. 7

Plan-view correlative SE-SEM, BF- and HAADF–STEM images of PTB7:PC71BM-based absorber layers taken at 30 keV that were processed from o-xylene solution a–c without DIO, d–f with 1 vol% DIO and g–i 3 vol% DIO. Images in are post-processed according to the procedure described in “Materials and methods” section

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