Fig. 7From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEMPlan-view correlative SE-SEM, BF- and HAADF–STEM images of PTB7:PC71BM-based absorber layers taken at 30 keV that were processed from o-xylene solution a–c without DIO, d–f with 1 vol% DIO and g–i 3 vol% DIO. Images in are post-processed according to the procedure described in “Materials and methods” sectionBack to article page