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Fig. 8 | Advanced Structural and Chemical Imaging

Fig. 8

From: Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Fig. 8

30 keV cross-section BF–STEM images of PTB7:PC71BM absorber layers processed from o-xylene solution a without DIO, with addition of b 1 vol% DIO and c 3 vol% DIO. The images were taken from specimens containing several stacked absorber layers. Thin dark layers in (a) and (c) consist of undissolved remnants of PEDOT:PSS as evidenced by EDXS mapping in Additional file 1: Fig. S3. A Pt protection layer is seen in b on the uppermost absorber layer of the stack. Images in a–c are post-processed according to the procedure described in “Materials and methods” section

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