Fig. 5
From: Detection of defects in atomic-resolution images of materials using cycle analysis
a Raw HAADF STEM image of Mo–V–M oxide. b Interpolated map of local intensity around every atomic column in panel a with the location of atomic columns shown. c Interpolated map of the cycle size associated with every atomic column in panel a with the location of atomic columns shown. d Raw HAADF STEM image of Bi-doped Si. e Location of every atomic column in panel d colored based on the local intensity around every atomic column. f Location of every atomic column in panel d colored based on the cycle size associated every atomic column