Thematic series on Ultrafast Electron Microscopy
Advanced Structural and Chemical Imaging welcomes submissions to the new thematic series of the 'Ultrafast Electron Microscopy'. The successful development of methods for visualizing the atomic-scale nature of matter has proven to be invaluable for enhancing our understanding of structure-function relationships in biological, chemical, and materials systems. Due to the dynamic nature of function, the need to understand fast, complex physical phenomena through direct in situ observation has stimulated the development of high time-resolution transmission electron microscopy (TEM). However, the increasingly recognized need to understand time dependent processes, ranging from the second to faster than the femtosecond scale, requires development of new capabilities that can obtain time dependent information with high energy and spatial resolution. While advanced x-ray methods provide important dynamical information, the physical characteristics of an ultrafast electron microscope would allow it to provide information for many types of samples not available from other methods. The development of the Ultrafast TEM (UTEM) now led to the emergence of new approaches for the direct elucidation of mechanisms of dynamic processes on the necessary spatiotemporal scales. This Thematic series shall highlight recent advances in this field and provide a forum to discuss the latest developments in the implementation and application of ultrafast methods in electron microscopy. Specifically, contributions related to the design and operation of new guns, electron optics, and detectors able to cope with the demands of imaging, diffraction and spectroscopy on the nanosecond to femtosecond timescale are encouraged. Moreover, all applications of ultrafast microscopy, diffraction and spectroscopy for the materials and biological sciences are encouraged.
The potential topics include, but are not limited to the following scopes:
- Fundamental challenges in designing ultrafast coherent and high-brightness microscopes (source, optical system, detection, and pump technology)
- Novel molecular and material processes unveiled by ultrafast electron microscopy, diffraction, and spectroscopy
- In-situ microscopy and spectroscopy techniques in a UTEM
- Novel processes unveiled by ultrafast microscopy, diffraction, and spectroscopy
- Materials under extreme environments
- Atomic scale single-particle dynamics and molecular processes
- Multimodality approaches in ultrafast electron microscopy
- Understanding and mitigating high intensity beam effects on materials
Before submitting your manuscript, please ensure you have carefully read the Instructions for Authors for Advanced Structural and Chemical Imaging. The complete manuscript should be submitted through the Advanced Structural and Chemical Imaging submission system. To ensure that you submit to the correct thematic series please select the appropriate section in the drop-down menu upon submission. In addition, indicate within your cover letter that you wish your manuscript to be considered as part of the thematic series on Ultrafast Electron Microscopy. All submissions will undergo rigorous peer review and accepted articles will be published within the journal as a collection.
Deadline for submissions
1 August 2017
Lead Guest Editor:
Volkan Ortalan, Purdue University
Submissions will also benefit from the usual advantages of open access publication:
- Rapid publication: Online submission, electronic peer review and production make the process of publishing your article simple and efficient
- High visibility and international readership in your field: Open access publication ensures high visibility and maximum exposure for your work - anyone with online access can read your article
- No space constraints: Publishing online means unlimited space for figures, extensive data and video footage
- Authors retain copyright, licensing the article under a Creative Commons license: articles can be freely redistributed and reused as long as the article is correctly attributed
For editorial enquiries please contact firstname.lastname@example.org.
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