Fig. 11
From: Smart Align—a new tool for robust non-rigid registration of scanning microscope data
a An example frame from an STM image series of SrTiO3 (001) trilines [41] (field of view = 40 × 40 nm2) and b the restored image from the frame series. Line profiles correspond to the regions indicated by the white lines. Note that both the tip-height artefacts (horizontal bright/dark bands) as well as the lateral distortions have been corrected. The periodicity along the ridge of the triline (≈2 Å spacing) is directly interpretable after restoration