Fig. 3
From: Smart Align—a new tool for robust non-rigid registration of scanning microscope data
Comparison of transformation field constraints diagnosed form an ADF time series of [100] MgO (y-direction shown only). Top-left, a simple 10-pixel Gaussian blurring; top-right, the row-locked equivalent. Note how the row-locked solution faithfully diagnoses the scanning distortions (horizontal bands) with no ‘leakage’ of the crystallographic structure. For completeness, the result of locking the rows across the slow-scan direction is shown bottom-left, indicating that the scanning distortions are not dominant along this direction. The reference image of the final iteration is shown for comparison. Colour scale shows units of pixels, and grey numbers indicate the total calculation time