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Advanced Structural and Chemical Imaging

Advanced Structural and Chemical Imaging Cover Image
Erratum
Open Access

Erratum: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets

  • Alex Belianinov1, 2Email author,
  • Rama Vasudevan1, 2,
  • Evgheni Strelcov1, 2,
  • Anton Ievlev1,
  • Chad Steed1, 7,
  • Sang Mo Yang1, 2, 4, 5,
  • Alexander Tselev1, 2,
  • Stephen Jesse1, 2,
  • Michael Biegalski2,
  • Galen Shipman1, 8,
  • Christopher Symons1, 7,
  • Albina Borisevich1, 3,
  • Rick Archibald1, 6 and
  • Sergei Kalinin1, 2
Advanced Structural and Chemical Imaging20151:11

https://doi.org/10.1186/s40679-015-0011-9

©  Belianinov et al. 2015

Received: 4 August 2015

Accepted: 4 August 2015

Published: 29 August 2015

The original article was published in Advanced Structural and Chemical Imaging 2015 1:6

After publication of this study [1], we found that Anton Ievlev was not listed among the authors. This error has now been corrected and the full list of authors contributing to this work is included. The Reference [119] has also been updated. The correct information is given below: A.V. Ievlev, S.V. Kalinin, Data encoding based on the shape of the ferroelectric domains produced by using a scanning probe microscope tip, Nanoscale (2015), doi:10.1039/c5nr02443a.

Notes

Declarations

Open Access This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.

Authors’ Affiliations

(1)
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, USA
(2)
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA
(3)
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, USA
(4)
Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, South Korea
(5)
Department of Physics and Astronomy, Seoul National University, Seoul, South Korea
(6)
Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, USA
(7)
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, USA
(8)
Computer, Computational, and Statistical Sciences, Los Alamos National Laboratory, Los Alamos, USA

References

  1. Belianinov, A, Vasudevan, R, Strelcov, E, Ievlev, A, Steed, C, Yang, SM, Tselev, A, Jesse, S, Biegalski, M, Shipman, G, Symons, C, Borisevich, A, Archibald, R, Kalinin, S: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets. Adv. Struct. Chem. Imaging. 1, 6 (2015)View ArticleGoogle Scholar

Copyright

© Belianinov et al. 2015

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