Coslette, V.E.: Radiation damage by electrons with special reference to the knock-on process, electron microscopy and analysis 1979. In Mulvey, T. (eds.), p. 177. IoP, London (1979)
Krivanek, O.L., Dellby, N., Murfitt, M.F., Chisholm, M.F., Pennycook, T.J., Suenaga, K., Nicolosi, V.: Gentle STEM: ADF imaging and EELS at low primary energies. Ultramicroscopy 110, 935–945 (2010)
Article
CAS
Google Scholar
Buban, J.P., Ramasse, Q., Gipson, B., Browning, N.D., Stahlberg, H.: High-resolution low-dose scanning transmission electron microscopy. J. Electron. Microsc. 59, 103–112 (2010)
Article
CAS
Google Scholar
Barton, B., Jiang, B., Song, C., Specht, P., Calderon, H., Kisielowski, C.: Atomic resolution phase contrast imaging and in-line holography using variable voltage and dose rate. Microsc. Microanal. 18, 982–994 (2012)
Article
CAS
Google Scholar
Suenaga, K., Sato, Y., Liu, Z., Kataura, H., Okazaki, T., Kimoto, K., Sawada, H., Sasaki, T., Omoto, K., Tomita, T., Kaneyama, T., Kondo, Y.: Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nat. Chem. 1, 415–418 (2009)
Article
CAS
Google Scholar
Phillips, P.J., Iddir, H., Abraham, D.P., Klie, R.F.: Direct observation of the structural and electronic changes of Li2MnO3 during electron irradiation. Appl. Phys. Lett. 105, 113905 (2014)
Article
Google Scholar
Jia, C.L., Mi, S.B., Barthel, J., Wang, D.W., Dunin-Borkowski, E., Urban, K.W., Thust, A.: Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image. Nat. Mat. 13, 1044–1049 (2014)
Article
CAS
Google Scholar
Van Aert, S., De Backer, A., Martinez, G.T., Goris, B., Bals, S., Van Tendeloo, G.: Procedure to count atoms with trustworthy single-atom sensitivity. Phys. Rev. B 87, 064107 (2013)
Article
Google Scholar
Xu, R., Chen, C.-C., Wu, L., Scott, M.C., Theis, W., Ophus, C., Bartels, M., Yang, Y., Ramezani-Dakhel, H., Sawaya, M.R., Heinz, H., Marks, L.D., Ercius, P., Miao, J.: Three-dimensional coordinates of individual atoms in materials revealed by electron tomography. Nat. Mat. 14, 1099–1103 (2015)
Article
CAS
Google Scholar
Chen, F.R., Van Dyck, D., Kisielowski, C.: In-line three-dimensional holography of nanocrystalline objects at atomic resolution, doi: 10.1038/ncomms10603 (2016)
Lolla, D., Gorse, J., Kisielowski, C., Miao, J., Taylor, P.L., Chase, G.G., Reneker, D.H.: Polyvinylidene fluoride molecules in nanofibers, imaged at atomic scale by aberration corrected electron microscopy. Nanoscale 8, 120–128 (2016)
Article
CAS
Google Scholar
Haber, J.A., Anzenburg, E., Yano, J., Kisielowski, C., Gregoire, J.M.: Multiphase nanostructure of a quinary metal oxide electrocatalyst reveals a new direction for OER electrocatalyst design. Adv. Energy Mater. 5, 1402307 (2015)
Article
Google Scholar
Zhu, Y., Ramasse, Q.M., Brorson, M., Moses, P.G., Hansen, L.P., Kisielowski, C.F., Helveg, S.: Visualizing the stoichiometry of industrial-style Co–Mo–S catalysts with single-atom sensitivity. Angew. Chem. Int. Ed. 53, 10723–10727 (2014)
Article
CAS
Google Scholar
Kisielowski, C., Freitag, B., Bischoff, M., van Lin, H., Lazar, S., Knippels, G., Tiemeijer, P., van der Stam, M., von Harrach, S., Stekelenburg, M., Haider, M., Uhlemann, S., Mueller, H., Hartel, P., Kabius, B., Miller, D., Petrov, I., Olson, E.A., Donchev, T., Kenik, E.A., Lupini, A.R., Bentley, J., Pennycook, S.J., Anderson, I.M., Minor, A.M., Schmid, A.K., Duden, T., Radmilovic, V., Ramasse, Q.M., Watanabe, M., Erni, R., Stach, E.A., Denes, P., Dahmen, U.: Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-angstrom information limit. Microsc. Microanal. 14, 469–477 (2008)
Article
CAS
Google Scholar
Kisielowski, C., Wang, L.-W., Specht, P., Calderon, H.A., Barton, B., Jiang, B., Kang, J.H., Cieslinski, R.: Real-time sub-Ångstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene. Phys. Rev. B. 88, 024305 (2013)
Article
Google Scholar
Kisielowski, C.: On the pressing need to address beam–sample interactions in atomic resolution electron microscopy. J. Mater. Sci. 5, 635–639 (2016)
Article
Google Scholar
Botton, G.A., Calderon, H.A., Kisielowski, C.: Preface. Micron 68, 140 (2014)
Article
Google Scholar
Stevens, A., Kovarik, L., Abellan, P., Yuan, X., Carin, L., Browning, N.D.: Applying compressive sensing to TEM video: a substantial frame rate increase on any camera. Adv. Struct. Chem. Imaging. 1, 10 (2015). doi:10.1186/s40679-015-0009-3
Article
Google Scholar
Jinschek, J.R., Helveg, S.: Image resolution and sensitivity in an environmental transmission electron microscope. Micron 43, 1156 (2012)
Article
CAS
Google Scholar
Kisielowski, C., Specht, P., Gygax, S.M., Barton, B., Calderon, H.A., Kang, J.H., Cieslinski, R.: Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy. Micron 68, 186 (2014)
Article
Google Scholar
Smith, D.J., McCartney, M.R.: Electron beam-induced surface reduction in transition-metal oxides. Ultramicroscopy 23, 299–304 (1987)
Article
CAS
Google Scholar
Batson, P.E., Dellby, N., Krivanek, O.L.: Sub-angstrom resolution using aberration corrected electron optics. Nature 418, 617–620 (2002)
Article
CAS
Google Scholar
Martin, A.V., Ishizuka, K., Kisielowski, C., Allen, L.J.: Phase imaging and the evolution of a gold-vacuum interface at atomic resolution. Phys. Rev. B 74, 172102 (2006)
Article
Google Scholar
Jiang, N., Spence, J.C.H.: On the dose-rate threshold of beam damage in TEM. Ultramicroscopy 113, 77–82 (2012)
Article
CAS
Google Scholar
Egerton, R., Li, P., Malac, M.: Radiation damage in TEM and SEM. Micron 35, 399–409 (2004)
Article
CAS
Google Scholar
Kisielowski, C.: Observing atoms at work by controlling beam-sample interactions. Adv. Mater. 27, 5838–5844 (2015)
Article
CAS
Google Scholar
Henderson, R., Glaeser, R.M.: Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals. Ultramicroscopy 16, 139–150 (1985)
Article
CAS
Google Scholar
Callaway, E.: The revolution will not be crystallized. Nature 525, 172 (2015)
Article
CAS
Google Scholar
Kisielowski, C., Wang, L.-W., Specht, P., Kang, J.H., Cieslinski, R.: Probing the onset of functional behavior by exciting reversible atom displacements using variable voltages and dose rates. Microsc. Microanal. 19(suppl 2), 1211–1212 (2013)
Google Scholar
Girit, C.O., Meyer, J.C., Erni, R., Rossell, M.D., Kisielowski, C., Yang, L., Park, C.H., Crommie, M.F., Cohen, M.L., Louie, S.G., Zettl, A.: Graphene at the edge: stability and dynamics. Science 323, 1705–1708 (2009)
Article
CAS
Google Scholar
Lichte, H., Lehmann, M.: Electron holography—basics and applications. Rep. Prog. Phys. 71, 48 (2008)
Article
Google Scholar
Pennycook, S.J., Rafferty, B., Nellist, P.D.: Z-contrast imaging in an aberration-corrected scanning transmission electron microscope. Microsc. Microanal. 6, 343–352 (2000)
Article
CAS
Google Scholar
Inada, H., Su, D., Egerton, R.F., Konno, M., Wu, L., Ciston, J., Wall, J., Zhu, Y.: Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms. Ultramicroscopy 111, 865–876 (2011)
Article
CAS
Google Scholar
Cowley, J.M., Hansen, M.S., Wang, S.-Y.: Imaging modes with an annular detector in STEM. Ultramicroscopy 58, 18–24 (1995)
Article
CAS
Google Scholar
Helveg, S., López-Cartes, C., Sehested, J., Hansen, P.L., Clausen, B.S., Rostrup-Nielsen, J.R., Abild-Pedersen, F., Nørskov, J.K.: Atomic-scale imaging of carbon nanofibre growth. Nature 427, 429 (2004)
Article
Google Scholar
Lentzen, M.: Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy. Microsc. Microanal. 14, 16–26 (2008)
Article
CAS
Google Scholar
Agiral, A., Soo, H.S., Frei, H.: Visible light induced hole transport from sensitizer 505 to Co3 O4 water oxidation catalyst across nanoscale silica barrier with embedded 506 molecular wires. Chem. Mater. 25, 2264–2274 (2013)
Article
CAS
Google Scholar
Yang, J., Toma, F.M., Cooper, J.K., Favaro, M., Wang, C., Zhu, C., Yano, J., Kisielowski, C., Schwartzberg, A., Sharp, I.D.: Highly active, multi-functional water oxidation catalysts engineered for integration with semiconductor light absorbers by atomic layer deposition, submitted (2016)
Kotousova, L.S., Polyakov, S.M.: Electron-diffraction study of Co3 O4. Kristallografiya 17, 661–663 (1972)
CAS
Google Scholar
Gerchberg, R.W., Saxton, W.O.: A practical algorithm for the determination of the phase from image and diffraction plane pictures. Optik 35, 237–246 (1972)
Google Scholar
http://www.totalresolution.com
Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., Yuan, G., Frei, H.: Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity. Micron 68, 176 (2015)
Article
CAS
Google Scholar
Kanaya, K.: The temperature distribution of specimens on this substrate supported by a circular opening in electron microscopy. J. Elect. Microsc. Jpn 3, 1 (1955)
Google Scholar
Zheng, H., Sadtler, B., Habenicht, C., Freitag, B., Alivisatos, A.P., Kisielowski, C.: Controlling electron beam-induced structure modifications and cation exchange in cadmium sulfide–copper sulfide heterostructured nanorods. Ultramicroscopy 134, 207–213 (2013)
Article
CAS
Google Scholar
Zheng, H., Rivest, J.B., Miller, T.A., Sadtler, B., Lindenberg, A., Toney, M.F., Wang, L.-W., Kisielowski, C., Alivisatos, A.P.: Observation of transient structural-transformation dynamics in a Cu(2)S nanorod. Science 333, 206–209 (2011)
Article
CAS
Google Scholar
Yeadon, M., Yang, J.C., Averback, R.S., Gibson, J.M.: Techniques for studying nanoparticle sintering by plan-view in situ transmission electron microscopy. Microsc. Microanal. 4, 248–253 (1998)
Article
CAS
Google Scholar
Rezikyan, A., Jibben, Z.J., Rock, B.A., Zhao, G., Koeck, F.A., Nemanich, R.F., Treacy, M.M.: Speckle suppression by decoherence in fluctuation electron microscopy. Microsc. Microanal. 21, 1455–1474 (2015)
Article
CAS
Google Scholar
Petitto, S.C., Marsh, E.M., Carson, G.A., Langell, M.A.: Cobalt oxide surface chemistry: the interaction of CoO(1 0 0), Co3O4(1 1 0) and Co3O4(1 1 1) with oxygen and water. J. Mol. Catal. A: Chem. 281, 49–58 (2008)
Article
CAS
Google Scholar